SN
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Scheduled Date
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Course Contents
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Certificate Course: Module 1
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1
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05.02.2024
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Fundamentals of Chip Design
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2
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06.02.2024
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Fundamentals of IC technologies
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3
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07.02.2024
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Fundamentals of logic design
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4
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08.02.2024
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Fundamentals of VHDL and Verilog
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5
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09.02.2024
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Fundamentals of FPGA System Design
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Certificate Course: Module 2
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6
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12.02.2024
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Fundamentals of PN junction diode
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7
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13.02.2024
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Design & Functionality of PN junction diode
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8
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14.02.2024
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Fundamentals of MOSFET
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9
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15.02.2024
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Design of MOSFET
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10
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16.02.2024
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Functionality of MOSFET & its Characteristics
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Certificate Course: Module 3
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11
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19.02.2024
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PN Junction Diode as Half Wave Rectifier, Full Wave Rectifier (Bridge Rectifier, Centre Tapped Rectifier)
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12
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20.02.2024
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Design of Zener Diode
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13
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21.02.2024
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Application of Zener Diode as Regulator
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14
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22.02.2024
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Design of JFET
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15
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23.02.2024
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Functionality of JFET and its Characteristics
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Certificate Course: Module 4
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16
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26.02.2024
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Logic Gates Design using MOSFET
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17
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27.02.2024
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Combinational Circuit Design using MOSFET (Mux, Demux)
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18
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28.02.2024
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Combinational Circuit Design using MOSFET (Decoder, Encoder, ALU)
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19
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29.02.2024
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Sequential Circuit Design using MOSFET (Flip-Flops)
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20
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01.03.2024
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Sequential Circuit Design using MOSFET (Registers, Counters)
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Certificate Course: Module 5
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21
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04.03.2024
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Introduction to Boolean Algebra
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22
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05.03.2024
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Introduction to Boolean Operators
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23
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06.03.2024
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Symbolic Representation, Boolean Algebraic Function & Truth Table of Different Logic Gates
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24
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07.03.2024
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Circuit Optimization Techniques by Boolean Axioms & K-Map
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25
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08.03.2024
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Design of Basic Gates using Universal Gates
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Certificate Course: Module 6
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26
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11.03.2024
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Introduction of VHDL
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27
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12.03.2024
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Important Terms of VHDL
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28
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13.03.2024
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Digital Logic Design using VHDL
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29
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14.03.2024
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Combinational Circuit Design using VHDL (Mux, Demu)
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30
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15.03.2024
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Combinational Circuit Design using VHDL (Decoder, Encoder, ALU)
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Certificate Course: Module 7
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31
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18.03.2024
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Introduction to Verilog
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32
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19.03.2024
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Programing of Verilog@HDL
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33
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20.03.2024
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Digital Logic Design using Verilog@HDL
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34
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21.03.2024
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Combinational Circuit Design using Verilog@HDL
(Mux, Demu)
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35
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22.03.2024
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Combinational Circuit Design using Verilog@HDL
(Decoder, Encoder, ALU)
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Certificate Course: Module 8
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36
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25.03.2024
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Concept of Bipolar Junction Transistors(BJT): NPN & PNP
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37
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26.03.2024
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NPN & PNP Transistors actions, Input and Output Characteristics of CB Configuration
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38
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27.03.2024
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NPN & PNP TransistorsInput and Output Characteristics of CE Configuration & its Applications
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39
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28.03.2024
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NPN & PNP Transistors Input and Output Characteristics of CC Configuration & its Applications
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40
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29.03.2024
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NPN & PNP Transistors DC & Load Line Analysis, Operating Points
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Certificate Course: Module 9
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41
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01.04.2024
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NPN & PNP Transistors Biasing strategies
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42
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02.04.2024
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NPN & PNP Fixed Bias, Emitter/Self Bias
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43
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03.04.2024
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NPN & PNP Low Frequency Response in CE Configuration
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44
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04.04.2024
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Relation between, Alpha, Betta & Gama
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45
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05.04.2024
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Logic Gates Design using NPN & PNP Transistors
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Certificate Course: Module 10
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46
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08.04.2024
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Sequential Circuit Design using Verilog@HDL: SR Flip Flop, D Flip Flop
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47
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09.04.2024
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Sequential Circuit Design using Verilog@HDL :T Flip Flop, JK Flip Flop
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48
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10.04.2024
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Sequential Circuit Design using Verilog@HDL: Master & Slave JK Flip Flop, Ring Counter
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49
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11.04.2024
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Sequential Circuit Design using Verilog@HDL: Asynchronous Counter, Synchronous Counter
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50
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12.04.2024
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Sequential Circuit Design using Verilog@HDL: Registers, Shift Registers
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Certificate Course: Module 11
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51
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15.04.2024
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Sequential Circuit Design using VHDL: SR Flip Flop, D Flip Flop
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52
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16.04.2024
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Sequential Circuit Design using VHDL: T Flip Flop, JK Flip Flop
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53
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17.04.2024
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Sequential Circuit Design using VHDL: Master & Slave JK Flip Flop, Ring Counter
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54
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18.04.2024
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Sequential Circuit Design using VHDL: Asynchronous Counter, Synchronous Counter
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55
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19.04.2024
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Sequential Circuit Design using VHDL: Registers, Shift Registers
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Certificate Course: Module 12
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56
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22.04.2024
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Design of Difference Amplifier using BJT
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57
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23.04.2024
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Design of Two Stage Operational Amplifier
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58
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24.04.2024
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Mathematical Analysis of Two stage Operational Amplifier
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59
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25.04.2024
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Characteristics of an Ideal and Practical Operational Amplifier (IC 741)
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60
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26.04.2024
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Inverting and Noninverting Amplifier (using IC741)
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Certificate Course: Module 13
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61
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29.04.2024
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Offset Error Voltages & Currents (using IC741)
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62
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30.04.2024
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Power Supply Rejection Ratio (PSRR), Slew Rate & Virtual Ground (using IC741)
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63
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01.05.2024
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Summing & Difference Amplifier (using IC741)
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64
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02.05.2024
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Differentiator & Integrator (using IC741)
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65
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03.05.2024
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RC Phase Shift Oscillator (using IC741)
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Certificate Course: Module 14
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66
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06.05.2024
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Concept of Positive & Negative Feedback
|
67
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07.05.2024
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Barkhausen Criterion for Sustained Oscillations
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68
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08.05.2024
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Determination of Frequency and Conditions of Oscillations
|
69
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09.05.2024
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RC Phase Shift Oscillator
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70
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10.05.2024
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Hartley & Colpits Oscillator
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Certificate Course: Module 15
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71
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13.05.2024
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MOSFET as Switch
|
72
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14.05.2024
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MOSFET Structure, MOS Symbols
|
73
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15.05.2024
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MOS I/V Characteristics, Threshold Voltage
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74
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16.05.2024
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Derivation of I/V Characteristics
|
75
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17.05.2024
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MOS Device Models, MOS Device Layout
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Certificate Course: Module 16
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76
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20.05.2024
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MOS Device Capacitances, MOS Small-Signal Model
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77
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21.05.2024
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MOS SPICE models, NMOS versus PMOS Devices
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78
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22.05.2024
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Long-Channel versus Short-Channel Devices
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79
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23.05.2024
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Single Stage Amplifier :Common-Source Stage
|
80
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24.05.2024
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Single Stage Amplifier: Common-Source Stage with Resistive Load
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Certificate Course: Module 17
|
81
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27.05.2024
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Single Stage Amplifier:CS Stage with Diode-Connected Load
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82
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28.05.2024
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Single Stage Amplifier: CS Stage with Current-Source Load
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83
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29.05.2024
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Single Stage Amplifier: Stage with Triode Load
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84
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30.05.2024
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Single Stage Amplifier: CS Stage with Source Degeneration & Source Follower
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85
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31.05.2024
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Single Stage Amplifier: Common-Gate Stage, Cascode Stage, Folded Cascode
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Certificate Course: Module 18
|
86
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03.06.2024
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Differential Amplifiers: Single-Ended and Differential Operation
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87
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04.06.2024
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Differential Amplifiers: Basic Differential Pair
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88
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05.06.2024
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Differential Amplifiers: Qualitative and Quantitative Analysis
|
89
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06.06.2024
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Differential Amplifiers: Common-Mode Response
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90
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07.06.2024
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Differential Amplifiers: Differential Pair with MOS Loads
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Certificate Course: Module 19
|
91
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10.06.2024
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Passive and Active Current Mirrors
|
92
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11.06.2024
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Basic Current Mirrors and Cascode Current Mirrors
|
93
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12.06.2024
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Active Current Mirrors and Gilbert Cell
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94
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13.06.2024
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Large-Signal and Small-Signal Analysis
|
95
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14.06.2024
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Frequency Response of Amplifiers: Miller Effect
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Certificate Course: Module 20
|
96
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17.06.2024
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Frequency Response of Amplifiers: Association of Poles with Nodes and Common-Source Stage
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97
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18.06.2024
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Frequency Response of Amplifiers: Source Followers and Common-Gate Stage
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98
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19.06.2024
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Frequency Response of Amplifiers: Cascode Stage and Differential Pair Feedback General Considerations
|
99
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20.06.2024
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Frequency Response of Amplifiers:Properties of Feedback Circuits & Feedback topologies
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100
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21.06.2024
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Frequency Response of Amplifiers: Voltage-Voltage Feedback and Current-Voltage Feedback
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Certificate Course: Module 21
|
101
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24.06.2024
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Frequency Response of Amplifiers: Voltage-Current Feedback and Current-Current Feedback
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102
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25.06.2024
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Frequency Response of Amplifiers: Effect of Loading and Two-Port Network Models
|
103
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26.06.2024
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Frequency Response of Amplifiers: Loading in Voltage-Voltage Feedback and Loading in Current-Voltage Feedback
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104
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27.06.2024
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Frequency Response of Amplifiers:Loading in Voltage-Current Feedback and Loading in Current-Current Feedback
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105
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28.06.2024
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Frequency Response of Amplifiers: Effect of Feedback on Noise
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Certificate Course: Module 22
|
106
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01.07.2024
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CMOS Operational Amplifiers: Performance Parameters
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107
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02.07.2024
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CMOS Operational Amplifiers: One-Stage Op Amps
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108
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03.07.2024
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CMOS Operational Amplifiers: Two-Stage Op Amps
|
109
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04.07.2024
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CMOS Operational Amplifiers: Gain Boosting and Comparison
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110
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05.07.2024
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CMOS Operational Amplifiers: Common-Mode Feedback and Input Range Limitations
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Certificate Course: Module 23
|
111
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08.07.2024
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CMOS Operational Amplifiers: Slew Rate and Power Supply Rejection
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112
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09.07.2024
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CMOS Operational Amplifiers:Stability and Frequency Compensation
|
113
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10.07.2024
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CMOS Operational Amplifiers: Phase Margin, Frequency Compensation,
|
114
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11.07.2024
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CMOS Operational Amplifiers:Compensation of Two-Stage Op Amps
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115
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12.07.2024
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CMOS Operational Amplifiers: Slewing in Two-Stage Op Amps, Other Compensation Techniques
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Certificate Course: Module 24
|
116
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15.07.2024
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Introduction to Testing: Testing Philosophy
|
117
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16.07.2024
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Introduction to Testing: Role of Testing
|
118
|
17.07.2024
|
Introduction to Testing : Digital and Analog VLSI Testing
|
119
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18.07.2024
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Introduction to Testing: VLSI Technology Trends Affecting Testing
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120
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19.07.2024
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VLSI Testing Process and Test Equipment: How to Test Chips?
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Certificate Course: Module 25
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121
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22.07.2024
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VLSI Testing Process and Test Equipment: Automatic Test Equipment
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122
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23.07.2024
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VLSI Testing Process and Test Equipment: Electrical Parametric Testing
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123
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24.07.2024
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VLSI Testing Process and Test Equipment: Faults in Digital Circuits (Failures and Faults, Modeling of Faults, Temporary Faults)
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124
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25.07.2024
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Test Generation for Combinational Logic Circuits: Fault Diagnosis of Digital Circuits
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125
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26.07.2024
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Test Generation for Combinational Logic Circuits: Test Generation Techniques for Combinational Circuits
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Certificate Course: Module 26
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126
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29.07.2024
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Test Generation for Combinational Logic Circuits: Detection of Multiple Faults in Combinational Logic Circuits
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127
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30.07.2024
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Test Generation for Combinational Logic Circuits: Testable Combinational Logic Circuit Design
|
128
|
31.07.2024
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Test Generation for Combinational Logic Circuits:The Reed-Mullar Expansion Technique
|
129
|
01.08.2024
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Test Generation for Combinational Logic Circuits: Three-Level OR-AND-OR Design
|
130
|
02.08.2024
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Test Generation for Combinational Logic Circuits: Automatic Synthesis of Testing Logic
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Certificate Course: Module 27
|
131
|
05.08.2024
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Test Generation for Combinational Logic Circuits: Testable Design of Multilevel Combinational Circuits
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132
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06.08.2024
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Test Generation for Combinational Logic Circuits: Synthesis of Random Pattern Testable Combinational Circuits
|
133
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07.08.2024
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Test Generation for Combinational Logic Circuits: Path Delay Fault Testable Combinational Logic Design
|
134
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08.08.2024
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Test Generation for Combinational Logic Circuits: Testable PLA Design
|
135
|
09.08.2024
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Practice Session for fault detection in Combinational Circuits
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Certificate Course: Module 28
|
136
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12.08.2024
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Test Generation for Sequential Circuits: Testing of Sequential Circuits as Iterative Combinational Circuits
|
137
|
13.08.2024
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Test Generation for Sequential Circuits: State Table Verification
|
138
|
14.08.2024
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Test Generation for Sequential Circuits: Test Generation Based on Circuit Structure
|
139
|
15.08.2024
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Test Generation for Sequential Circuits: Functional Fault Models
|
140
|
16.08.2024
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Test Generation for Sequential Circuits: Test Generation Based on Functional Fault Models
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Certificate Course: Module 29
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141
|
19.08.2024
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Design of Testable Sequential Circuits: Controllability and Observability
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142
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20.08.2024
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Design of Testable Sequential Circuits: Ad Hoc Design Rules for Improving Testability
|
143
|
21.08.2024
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Design of Testable Sequential Circuits: Design of Dignosable Sequential Circuits
|
144
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22.08.2024
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Design of Testable Sequential Circuits: The Scan-Path Technique for Testable Sequential Circuit Design
|
145
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23.08.2024
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Design of Testable Sequential Circuits: Level-Sensitive Scan Design
|
Certificate Course: Module 30
|
146
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26.08.2024
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Design of Testable Sequential Circuits: Random Access Scan Technique,
|
147
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27.08.2024
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Design of Testable Sequential Circuits:Partial Scan
|
148
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28.08.2024
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Design of Testable Sequential Circuits:Testable Sequential Circuit Design Using Nonscan Techniques
|
149
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29.08.2024
|
Design of Testable Sequential Circuits:Cross Check and Boundary Scan
|
150
|
30.08.2024
|
Built-In Self-Test: Test Pattern Generation for BIST
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Certificate Course: Module 31
|
151
|
02.09.2024
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Built-In Self-Test: Output Response Analysis
|
152
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03.09.2024
|
Built-In Self-Test: Circular BIST & BIST Architectures
|
153
|
04.09.2024
|
Testable Memory Design: RAM Fault Models
|
154
|
05.09.2024
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Testable Memory Design: Test Algorithms for RAMs and Detection of Pattern Sensitive Faults
|
155
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06.09.2024
|
Testable Memory Design: BIST Techniques for RAM Chips and Test Generation and BIST for Embedded RAMS
|
Certificate Course: Module 32
|
156
|
09.09.2024
|
Random Access Memory Technologies: Static Random Access Memories (SRAMs)
|
157
|
10.09.2024
|
Random Access Memory Technologies: SRAM Cell Structures and MOS SRAM Architecture
|
158
|
11.09.2024
|
Random Access Memory Technologies:MOS SRAM Cell and Peripheral Circuit
|
159
|
12.09.2024
|
Random Access Memory Technologies:Bipolar SRAM, SOl and Advanced SRAM Architectures
|
160
|
13.09.2024
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Random Access Memory Technologies:Error Failures in DRAM, Advanced DRAM Design and Architecture, Application of Specific DRAM
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Certificate Course: Module 33
|
161
|
16.09.2024
|
Non-Volatile Memories:High Density ROMs and PROMs
|
162
|
17.09.2024
|
Non-Volatile Memories: Bipolar & CMOS PROM
|
163
|
18.09.2024
|
Non-Volatile Memories:EEPROMs and Floating Gate EPROM Cell
|
164
|
19.09.2024
|
Non-Volatile Memories:OTP EPROM and EEPROMs
|
165
|
20.09.2024
|
Non-Volatile Memories:Nonvolatile SRAM and Flash Memories
|
Certificate Course: Module 34
|
166
|
23.09.2024
|
Semiconductor Memory Reliability and Radiation Effects: General Reliability Issues, RAM Failure Modes and Mechanism
|
167
|
24.09.2024
|
Semiconductor Memory Reliability and Radiation Effects: Nonvolatile Memory, Reliability Modeling and Failure Rate Prediction
|
168
|
25.09.2024
|
Semiconductor Memory Reliability and Radiation Effects: Reliability Screening and Qualification. Radiation Effects
|
169
|
26.09.2024
|
Semiconductor Memory Reliability and Radiation Effects: SEP and Radiation Hardening Techniques.
|
170
|
27.09.2024
|
Semiconductor Memory Reliability and Radiation Effects: Process and Design Issues, Radiation Hardened Memory Characteristics and Radiation Hardness Assurance and Testing.
|
Certificate Course: Module 35
|
171
|
30.09.2024
|
Advanced Memory Technologies and High-density Memory Packing Technologies:: Ferroelectric Random Access Memories (FRAMs), Gallium Arsenide (GaAs) FRAMs
|
172
|
01.10.2024
|
Advanced Memory Technologies and High-density Memory Packing Technologies:Analog Memories and Magneto Resistive Random Access Memories (MRAMs)
|
173
|
02.10.2024
|
Advanced Memory Technologies and High-density Memory Packing Technologies:Experimental Memory Devices
|
174
|
03.10.2024
|
Advanced Memory Technologies and High-density Memory Packing Technologies: Memory Hybrids (2D & 3D), Memory Stacks, Memory Testing and Reliability Issues
|
175
|
04.10.2024
|
Advanced Memory Technologies and High-density Memory Packing Technologies:Memory Cards, High Density Memory Packaging, Future Directions, Introduction to digital tablet PC, LCD and DVD player
|
Certificate Course: Module 36
|
176
|
07.10.2024
|
VLSI physical design automation::VLSI Design cycle and New trends in VLSI design
|
177
|
08.10.2024
|
VLSI physical design automation: Physical design cycle and Design style
|
178
|
09.10.2024
|
VLSI physical design automation: Design rules & layout of basic devices
|
179
|
10.10.2024
|
VLSI automation Algorithms Partitioning:Problem formulation, and classification of partitioning algorithms
|
180
|
11.10.2024
|
VLSI automation Algorithms Partitioning:Group migration algorithms and simulated annealing
|
Certificate Course: Module 37
|
181
|
14.10.2024
|
Floor planning & pin assignment: Problem formulation and classification of floorplanning algorithms
|
182
|
15.10.2024
|
Floor planning & pin assignment:constraint based floor planning, floor-planning algorithms for mixed black & cell design
|
183
|
16.10.2024
|
Floor planning & pin assignment:chip planning, pin assignment, and problem formulation
|
184
|
17.10.2024
|
Floor planning & pin assignment:classification of pin assignment algorithms, General & channel pin assignment Placement Problem formulation
|
185
|
18.10.2024
|
Floor planning & pin assignment:, classification of placement algorithms, simulation base placement algorithms and recent trends in placement
|
Certificate Course: Module 38
|
186
|
20.10.2024
|
Global Routing and Detailed routing:Problem formulation, classification of global routing algorithms and Maze routing algorithm
|
187
|
21.10.2024
|
Global Routing and Detailed routing:line probe algorithm and Steiner Tree based algorithms
|
188
|
22.10.2024
|
Global Routing and Detailed routing:performance driven routing Detailed routing problem formulation and classification of routing algorithms
|
189
|
23.10.2024
|
Global Routing and Detailed routing: introduction to single layer routing algorithms and two layer channel routing algorithms,
|
190
|
24.10.2024
|
Global Routing and Detailed routing:greedy channel routing and switchbox routing algorithms
|
Certificate Course: Module 39
|
191
|
27.10.2024
|
Over the cell routing & via minimization:Two layers over the cell routers
|
192
|
28.10.2024
|
Over the cell routing & via minimization:constrained & unconstrained via minimization
|
193
|
29.10.2024
|
Compaction:Problem formulation
|
194
|
30.10.2024
|
Compaction:classification of compaction algorithms
|
195
|
31.10.2024
|
Compaction:one dimensional compaction, two dimension based compaction, hierarchical compaction
|
Certificate Course: Module 40
|
196
|
01.11.2024
|
IC Technology & Fabrication: Wafer Preparation
|
197
|
02.11.2024
|
IC Technology & Fabrication: Oxidation
|
198
|
03.11.2024
|
IC Technology & Fabrication:Photolithography & Etching
|
199
|
04.11.2024
|
IC Technology & Fabrication:Diffusion & Ion Implantation
|
200
|
05.11.2024
|
IC Technology & Fabrication: Metalization
|